IEC the Standard Jointed Test Finger Probe B. IP2X Protection Probe. 1. Conforms to: Standard IEC , IEC , IRAM. IEC Test Probe 13 Meets IEC CSA & UL Requirements, Supplier Wholesale Precision Test Probes IEC Short Probe Find the most up-to-date version of IEC at Engineering
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A special disk for the metal finger is also required by GR requirements. Product Details This probe is intended to verify protection iev persons against access to hazardous parts for an IP1 Code. Made entirely of stainless steel.
The unit includes a banana jack in the handle to check continuity, as required. Aluminum Box Delivery Time: NIST tracealbe certificate is included.
These cones are made of Anodized Aluminum. Product Details Used to verify protection against access to hazardous parts through top openings. Main specification and corresponding technical parameters: Product Details This probe is intended to verify the basic protection against access to 60132 parts.
In many standards, this probe is used for access to enamel coated wire i.
Unit is NIST traceable, measurement data is available at a nominal charge and cases are available. This product is used with TFP as an accessory. These are high precision probes made in exact accordance with IEC.
IEC 61032 Test Pin
Large baffle test finger. Kits can be created for other standards on request. Made entirely of nickel-plated steel. Probe Kits offer substantial cost savings, not to mention added convenience and portability!
Both the disk and the finger are certified to meet the GR requirements.
Precision IEC Test Equipment , IEC Figure 2 Test Finger Probe B
This exclusive new design is high-precision machined of aluminum with a stainless steel tip. Complies with UL Standards. NIST traceable measurement data is available at a nominal charge. Product Details Probe kits offer substantial cost savings and added convenience. Product Details For testing enclosure rigidity in accordance with clause idc.
Product Details Used on enclosures prior to accessibility testing.
Precision IEC Test Equipment , IEC 61032 Figure 2 Test Finger Probe B
Guangzhou Hongce Equipment Co. Meets IEC andas well as other national and international standards. Product Details Several Different accessibility probe kits are available for specific standards. IEC EN This underscores their lack of knowledge of the requirements as you do not perform the test with the unit energized!
We provide you with industry leading test equipment, advanced online system and solutions—anywhere in the world. Product Details This pin is used on appliances for verifying that there is no access to hazardous live parts of heating elements which could be touched accidentally by a tool i. Standard test finger with force.
IEC /COR | IEC Webstore
Product Details Used for assessing the risk of neck entrapment in v-shaped openings in medical 661032. The test hook is hooked into vents and seams in the enclosure and then pulled with a force usually 20N.
Palm simulator and restricted joint movement simulates human finger movement. Unit comes with NIST traceable certificate and cases are avaiable. If you have skype or whatsapp, pls tell me, we can chat more smoothly. Made of all nylon.